Backside Power-Delivery Ramp Leader — Mobile Processors

The mandate

The interim leader must establish a joint electrical and manufacturability window for backside-power delivery, bringing design teams and process modules into alignment across reference flows without moving unexplained loss into design guard-bands.

Sixteen months provide the ramp window. The first sixty days contain questionable lots, align frontside and backside genealogy and establish physical-to-electrical paretos. Months three through nine close via formation, bonding, thinning, alignment and thermal mechanisms. Months ten through fourteen qualify tool populations and design rules. The final two months prove output stability, install a permanent leader and transfer next-generation integration decisions.

Handover is achieved when backside-via yield, bond integrity, wafer geometry and product power delivery meet approved targets across qualified tools for twelve continuous production weeks. The successor must chair one wafer-hold decision, approve an integration-window change and reconcile silicon measurements with design extraction before the ramp council. Engineering-only carriers, favourable product blocks and hidden frontside compensation cannot count as sustained capability.

The leader may hold wafers, set integration targets inside authorised device rules, allocate engineering equipment, prioritise destructive analysis, control learning-lot starts and commit EUR 25 million within the recovery envelope. They decide process release after documented product and reliability consultation. Processor architecture, customer power claims, new-fab capital, foundry contracts and final product qualification remain with designated executives.

Excluded are redesigning the processor, owning all frontside yield, selecting the next technology node or replacing factory automation. The mandate covers backside power integration and its accountable transfer into volume for the selected family. Patent positions, supplier liability and customer commercial remedies remain outside the interim seat, using its protected physical evidence where relevant.

Why this seat is open

Backside delivery couples buried interconnect formation, wafer mechanics, bonding, thermal paths, extraction and frontside design assumptions. The departure left module leaders able to defend individual specifications while no executive owns the promised product-level power result. A temporary leader can make expensive holds and experiment choices now, then leave a successor with qualified tools and measured design correlation.

What you will own

• Establish genealogy linking frontside process, backside vias, carrier, bond interface, thinning, alignment, metallisation, package and product measurements.
• Connect via resistance, contact integrity, overlay, voids, wafer bow and thermal behaviour to voltage-drop and timing consequence.
• Govern learning lots and splits across via formation, bonding, grind, stress relief, clean and backside metal modules.
• Reconcile extraction, design rules and silicon power measurements across blocks, activity modes, temperature and package conditions.
• Qualify tool populations through chamber matching, carrier history, consumable life, maintenance state and representative product corners.
• Direct equipment and materials suppliers through mechanism-based containment, corrective action, qualification and deviation expiry.
• Transfer process windows, design assumptions, open mechanisms, capital choices and successor-led wafer-release evidence.

Candidate qualifications

• Led backside power, wafer-bonded integration or similarly complex advanced-node process transfer into volume manufacturing.
• Can evidence a wafer-integration mechanism that erased an expected product power or routing benefit.
• Understands buried vias, bonding, thinning, alignment, wafer stress, backside metallisation and power-delivery extraction.
• Has governed scarce learning lots across process and design teams during a schedule-critical technology ramp.
• Directed destructive physical analysis and electrical correlation with complete carrier, tool and wafer genealogy.
• Developed a successor capable of challenging both process-module compliance and optimistic design guard-bands.